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| scanning electron microscope laboratory |
- For the study of surfaces at high magnifications (up to 400,000x). Surface morphology for fracture analysis, coating defects, porosity, chemical analysis and micro-structural studies, Grain boundary and deformation texture analysis using EBSP channelling patterns.
- Associated sample preparation equipments – sputter coater and ion milling machine
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v2.4 © 2008 GIK Institute of Engineering Sciences
and Technology, Topi (23640), Khyber Pakhtunkhwa, Pakistan.
Telephone: (0938) 271858 (20 lines) Fax: (0938) 271865, 271877
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