Advanced Microscopy and Micro/Nanostructural Characterization of Materials


Lead Instructor (s):

Dr. Muh AMmad Imran Khan Dr. Yasir Faheem Joya Engr. S. Z AMeer Abbas
PhD PhD MS

Dates:

17 August 2017

Course Fee:

PKR 18,000/-


This course has limited enrollment. Apply early to guarantee your spot.


Overview

Materials characterization is backbone of engineering products of any industry. In Pakistan the knowhow of materials characterization is not sufficient especially in the local industrial environment. This is the reason that our local industry is facing problems regarding quality issues of the products to compete in the international market.

Scanning Electron Microscopy (SEM) i use a focused electron beam for high quality microstructural imaging and also applied for elemental analysis of materials. Advanced FEG-SEM and ESEM allows in-depth characterization of nanomaterial’s, biomaterials and micro-organisms such as bacteria at high optical resolution. Atomic Force Microscopy (AFM) uses forces produced during atomic level interaction of sample and a cantilever tip. The variation in interaction of forces is used to make a 3D image and offers a lot more functionalities by the instrument.

The above mentioned three characterization tools can be very helpful for the local industry and their knowhow can contribute to improve the quality of our local products.

Who should attend?

This program is for anyone who wants to update his knowledge in materials properties assessment and develop hands on skills in using modern technology and tools for analysis.

Especially for:

  • University students
  • Practicing engineers
  • Quality Managers
  • Scientists and research scholars
  • Trainers

What will you learn?

The course will not only provide a theoretical background but will also provide a hands-on experience to data collection and data analysis, complemented by lecture instructions and lab sessions. After completion of this course attendees will be able to;

  • Select and apply suitable analytical technique to assess materials properties
  • Independently operate an SEM and AFM
  • Apply them to ex AMine materials and analyze their key properties.  
  • Compile data more effectively and extract useful information about materials

PROGRAM OUTLINE

Day 0
7:00 PM Arrival
8:00-9:30 PM Dinner
Day 1
8:00-8:30 AM BREAKFAST
8:30-8:45 AM Introductions
  • Introduction of the speaker and keynote speaker.
  • Introduction of attendees with a brief discussion of their experience and expectations.
8:45-9:30 AM Why Materials characterization is essential?
  • Degradation, and Failure of Materials
  • Engineering Economy
  • Ex AMples in industry and academia
9:30-10:45 AM Usefulness of SEM and AFM
  • Physical appearance and Morphology
  • Microstructure
  • Chemical Composition
  • Macro, Micro and Nano scale characterization
10:45-11:00 AM TEA BREAK
11:00-12:00 PM SEM to ESEM
  • Basics of SEM
  • Modes
  • FEGSEM and modes
  • ESEM and modes & Advanced applications
12:00-01:00 PM AFM
  • Introduction to the basic theory of AFM
  • Working principle and construction of an AFM
  • Topographic study of materials at Nano-scale using AFM
  • Role of AFM in advanced materials characterization
01:00-02:15 PM LUNCH AND PRAYER BREAK
02:15-03:00 PM AFM
03:00-03:45 PM
  • Basics and Operating modes
  • Emerging Application in Biotechnology, Nanotechnology
03:45-05:00 PM Hands on Instrumentation
  • SEM s AMple analysis AFM s AMple analysis
05:00-05:30 PM TEA

Departure